In cooperation with the US EMC Standards Corporation
ANSI C63.4: Testing Unintentional Emitters
The American National Standards Institute standard ANSI C63.4 is the key standard for measuring electrical and electronic equipment for showing compliance to FCC and Industry Canada regulations.
The standard is also used for showing compliance for unintentional radiators other than ITE. Unintentional emitters are devices that generate radio frequency energy for use within the device and is not intended to emit RF energy by radiation or induction. Billions of such electronic devices are used in every part of our lives.
This webinar will focus on the latest edition of C63.4 which is in final editing for an expected publication on or before the end of March of this year. This edition has significant new material over that of its 2003 and 2009 editions. This includes for example new product setup details, test site requirements for use above 1 GHz, allowance of the use of hybrid antennas, addition of measurement uncertainty requirements, and application to Industry Canada requirements in addition to that of the FCC. It is anticipated that the 2014 edition will overtake the current request of the FCC to adopt only the 2009 edition. The webinar will provide any update to the plans for petitioning the FCC for referencing only ANSI C63.4-2014 in the FCC Rules.
The webinar will focus on the 2014 edition of the standard. It would be helpful but not a requirement for attendees to have a copy of the 2014 edition as Don will refer to it throughout the webinar.
Who Should Attend
Wireless device designers, compliance engineers, test laboratory engineers/technicians, regulatory product managers, lab assessors, test instrumentation and test facility developers, and calibration lab technicians.
Donald Heirman is president of Don HEIRMAN Consultants which is a training, standards, and educational electromagnetic compatibility (EMC) consultation corporation. Previously he was with Bell Laboratories for over 30 years in many EMC roles including Manager of Lucent Technologies (Bell Labs) Global Product Compliance Laboratory, which he founded, and where he was in charge of the Corporation’s major EMC and regulatory test facility and its participation in ANSI accredited standards and international EMC standardization committees. He chairs, or is a principal technical contributor to, US and international EMC standards organizations including ANSI ASC C63® (immediate past chairman), the Institute of Electrical and Electronics Engineers, and the International Electrotechnical Commission’s (IEC) International Special Committee on Radio Interference (CISPR).
He was named chairman of CISPR in October 2007. He is a member of the IEC’s Advisory Committee on EMC (ACEC) and the Technical Management Committee of the US National Committee of the IEC. In November 2008 he was presented with the prestigious IEC Lord Kelvin award at the IEC General Meeting in Sao Paulo, Brazil. This is the highest award in the IEC and recognizes Don’s many contributions to global electrotechnical standardization in the field of EMC. He is a life Fellow of the IEEE and an honored life member of the IEEE EMC Society (EMCS) and member of its Board of Directors, chair of its technical committees on EMC measurements and Smart Grid, vice president for standards, past EMCS president, and past chair of its standards development committee. He is also past president of the IEEE Standards Association (SA), past member of the SA Board of Governors and past member of the IEEE’s Board of Directors and Executive Committee. He is also the Associate Director for Wireless EMC at the University of Oklahoma Center for the Study of Wireless EMC. Currently he is a voting member of the Smart Grid Interoperability Panel and its Testing and Certification Committee. In addition he is a focus leader on the NIST Electromagnetic Interoperability Issues Working Group which is providing EMC recommendations for Smart Grid equipment and systems.
The following information will be covered in the webinar: